Static, Dynamic and Integrated Solutions for Fault Diagnosis

Fault diagnosis techniques for digital integrated circuits have been classified into three categories: static (using pre-computed information), dynamic (using simulation at run-time) and integrated (using a combination of pre-computed information and simulation). This paper presents our research in all three areas. We first present our tree-based theoretical framework, which improves static fault diagnosis by providing significant reductions in fault dictionary storage. Dynamic diagnosis is improved by reducing run-time simulation with the help of critical path tracing. Finally, we present integrated solutions to diagnosis based on the selective storage of state information.